The ability to observe an object is a critical component of analysis. Diarkis employs a Hitachi S-4800 ultra high resolution scanning electron microscope (SEM) to analyze sample features that are too small to observe with a traditional microscope. An added benefit of the SEM is the ability to analyze the chemical composition of a sample using Energy Dispersive X-Ray Spectroscopy (EDS).

Hitachi S-4800 UHR FE-SEM

The S-4800 has the ability to resolve features as small as one nanometer, making it an excellent choice for materials analysis and thin film characterization. Users can easily and quickly capture images with integrated imaging software. The SEM can accommodate samples up to 200mm in diameter and less than 250mm in height.

Oxford Instruments EDS System

An additional benefit of using the SEM for sample characterization is the ability to perform chemical analysis. The integrated EDS system makes it possible to determine the chemical composition of an unknown sample. An elemental mapping feature shows the location of elements within the sample.

Diarkis is capable of providing either of these services to customers with the need for precise analysis. For more information and a quote regarding your inquiry please contact Mike Greenwald at 704-888-5244 ext. 41.